A Comparative Review of Surface Characterization Techniques in Nanotechnology: Strengths, Limitations, and the Central Role of XPS: A Comparative Review of Surface Characterization Techniques in Nanotechnology. مجلة التربوي, [S. l.], n. 28, p. 32–18, 2026. DOI: 10.65137/tj.v28.167. Disponível em: https://tarbawej.elmergib.edu.ly/index.php/tarbawe/article/view/167.. Acesso em: 8 2026.