A Comparative Review of Surface Characterization Techniques in Nanotechnology: Strengths, Limitations, and the Central Role of XPS: A Comparative Review of Surface Characterization Techniques in Nanotechnology. التربوي [انترنت]. 1 أبريل، 2026 [وثق 8 أبريل، 2026];(28):32-18. موجود في: https://tarbawej.elmergib.edu.ly/index.php/tarbawe/article/view/167